high-voltage probe

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• High-resolution transmission electron microscopy — (HRTEM) is an imaging mode of the transmission electron microscope (TEM) that allows the imaging of the crystallographic structure of a sample at an atomic scale. [cite book |title=Experimental high resolution electron microscopy |last=Spence… …   Wikipedia

• High impedance — In electronics, high impedance(also known as hi Z, tri stated, or floating) is the state of an output terminal which is not currently driven by the circuit. In digital circuits, it means that the signal is neither driven to a logical high nor low …   Wikipedia

• Test probe — Typical passive oscilloscope probe being used for testing an integrated circuit. A test probe (test lead, test prod, or scope probe) is a physical device used to connect electronic test equipment to the device under test (DUT). They range from… …   Wikipedia

• Huygens probe — Infobox Spacecraft Name = Huygens probe Caption = A scale replica of the probe, 1.3 metres across. Organization = ESA/ASI/NASA Major Contractors = Aérospatiale, now Thales Alenia Space Mission Type = Lander Satellite Of = Saturn Launch = December …   Wikipedia

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• Langmuir probe — A Langmuir probe is a device named after Nobel Prize winning physicist Irving Langmuir, used to determine the electron temperature, electron density, and electric potential of a plasma. It works by inserting one or more electrodes into a plasma,… …   Wikipedia

• Scanning voltage microscopy — (SVM) sometimes also called nanopotentiometry is a scientific experimental technique based on atomic force microscopy. A conductive probe, usually only a few nanometers wide at the tip, is placed in full contact with an operational electronic or… …   Wikipedia

• Mercury probe — The Mercury Probe is an electrical probing device to make rapid, non destructive contact to a sample for electrical characterization. Its primary application is semiconductor measurements where time consuming metallizations or photolithographic… …   Wikipedia

• Scanning probe microscopy — Part of a series of articles on Nanotechnology …   Wikipedia

• Atom probe — The atom probe is an atomic resolution microscope used in materials science that was invented in 1967 by Erwin Müller, J. A. Panitz, and S. Brooks McLane [cite journal|last=Müller|first=Erwin W.|authorlink=Erwin Müller|coauthors=John A. Panitz, S …   Wikipedia

• equipment — Synonyms and related words: Lecher wires, RC oscillator, VOM, VTVM, ability, accessories, accouterment, accouterments, adaptation, adjustment, ammeter, anemometer, anemoscope, apparatus, appliances, appointments, appurtenances, armament,… …   Moby Thesaurus